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    - OL 750 Automated Spectroradiometric Measurement System
   
       
   Product Description:
  

The OL 750 is an extremely versatile spectroradiometric measurement system capable of performing a variety of highly accurate optical radiation measurements under computer control in the ultraviolet, visible and infrared. The modular approach of the OL 750 coupled with an extensive selection of accessories and powerful application software packages enables the user to tailor a turn-key system to their exact requirements as well as ensure expandability in the future. Both single (OL 750S) and double (OL 750D) grating monochromator versions are available. The basic system, along with an extensive selection of optional items and accessories, enables the OL 750 to measure over all or part of the entire 200 nm to 30 mm wavelength range.

 
   Application Type:  
Source spectral analysis, detector spectral response, diffuse spectral reflectance, specular spectral reflectance, spectral transmittance
 
   Spectral Range:
200 nm - 30 µm
 
   Units Of Measure:  
W/cm² nm, W/cm² str nm
 
   Option/Configuration:
Various - contact factory
 
   Associated Links :
   Photovoltaics: Spectroradiometer Improves Accuracy of Photovoltaics Measurement
 
   Associated Documents :
   OL 750 Automated Spectroradiometric Measurement System (Bulletin 200)
   Spectroradiometry Methods (Application Note A14)
   OL Series 750 Automated Spectroradiometric Measurement System Spectral Sensitivity Performance Specifications (Information Sheet IS8)
   OL 750/ OL 754 DOS Application Software Minimum Recommended Computer Configuration (Information Sheet IS9A)
   OL Series 750 Monochromator/ Grating Specifications (Information Sheet IS10)
   Windows 2000/ XP Compatible Software for the OL Series 750 Spectroradiometer (Information Sheet IS24)
   Automated Spectroradiometric Systems: Components and Applications (Reprint R2)
   Instrumentation Advances Enhance Spectroradiometers (Reprint R12)
 
   Hardware/Software History :
   Revision 1.25
 
   Accessories :
   OL 730-8 Reflex Microscope (Bulletin 71)
   OL 730-9A and -9Q Reflex Telescope (Bulletin 115)
   OL 740-4P Off Axis Parabola Telescope (Bulletin 72)
   OL 740-18 and -19 Infrared Detector Module (Bulletin 114)
   OL 740-20 High Intensity Source Attachment (Bulletin 65)
   OL 740-70 Integrating Sphere Diffuse Reflectance Attachment (Bulletin 66)
   OL Series 750 High Sensitivity Detectors (Bulletin 122)
   OL 750-10 All Mirror Collimating and Focusing Optic (Bulletin 140)
   OL 750-75MA Goniospectroreflectance Attachment (Bulletin 76)
   OL 750-423P Pulse Source Measurements with the OL Series 750 (Bulletin 130)
   OL IS-430-DP Integrating Sphere (Bulletin 109)
 
   Product Videos :
   n/a
 
Detector spectral response (DSR) characterization (or calibration) involves a comparison of the responsivity of a sample detector against a reference detector standard, where the spectral profile is known and traceable. The OL 750 DSR configuration automates this process. The user need only follow the 'scan wizard' in the software to yield usable data.  



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4632 36th Street Orlando, FL  32811              
Phone: 407-422-3171 Toll Free: 800-899-3171

 

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