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Source Spectral Analysis - Spectral output of radiating sources, 200 - 30,000 nm. |
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NVG Measurements |
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OL Series 750-NVG Automated Spectroradiometric Measurement System configured specifically for certification of NVIS compatible lighting per the requirements of MIL-L-85762A |
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OL 770-NVS Display Test and Measurement System specifically configured for spectroradiometric certification of NVIS compatible lighting systems |
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OL Series 750 for NVIS filter measurements |
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Detector Spectral Response - Measurement of the spectral sensitivity of various detectors and radiometers. |
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Total Spectral Flux Measurements - Measurement of the radiometric & photometric output of a lamp in all directions. |
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Diffuse Spectral Reflectance - Total hemispherical reflectance of materials which scatter as they reflect. |
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Specular Spectral Reflectance - Measurement of the specular reflectance of polished materials or mirrors as a function of both wavelength and angle of incident radiation. |
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Spectral Transmittance - Measurement of regular (linear) and diffuse (scattered) transmittance of a material. |
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LED Spectral Analysis - Quantifying photometric & radiometric properties of LEDs (200 - 1100 nm). |
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Display Measurement - a complete solution for modern display measurement requirements |
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Solar Spectral Irradiance |
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Sunbed Compliance Testing - Measurement of spectral irradiance from 200-710 nm and the calculation of maximum exposure time for erythema (Te), melanogenesis (Tm) and .75 minimal erythmal dose (MED) as specified in CDRH guidelines. |
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Threshold Limit Values for Physical Agents in the Workplace - Levels of exposure in regard to Light, Near-Infrared and Ultraviolet radiation under which it is believed that nearly all healthy workers may be repeatedly exposed without adverse health effects. |
