The OL 750 Spectroradiometer can be configured to measure total hemispherical reflectance of materials which scatter as they reflect
with the addition of the OL Series 740-20 High Intensity Source Attachment and OL Series Power Supply, the
OL 740-70 Integrating Sphere Reflectance Attachment, and the OL 750-427 Diffuse Spectral Reflectance Application Software. Diffuse spectral reflectance measurements can be made including or excluding the specular component on materials such as:
- Powders
- Cosmetics
- Glasses
- Paints
- Plastics
- Foods
The diagram below illustrates an OL Series 750 Automated Spectroradiometric Measurement System configured for Diffuse Spectral Reflectance. Selecting a component illustrated in the diagram will provide a short description of the item.
Typical Spectral Diffuse Reflectance/Transmittance
Measurement System Optical Layout
